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Simulation of the influence of secondary electrons on the performance of potential depressed collectors for TWTs

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dc.contributor.author Musyoki, Stephen
dc.contributor.author Takahashi, M
dc.contributor.author Uchikawa, T
dc.date.accessioned 2015-05-26T15:53:55Z
dc.date.available 2015-05-26T15:53:55Z
dc.date.issued 2000
dc.identifier.citation . International Vacuum Electronics Conference, 02 May 2000-04 May 2000 Monterey, CA, USA en_US
dc.identifier.uri http://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=847511&url=http%3A%2F%2Fieeexplore.ieee.org%2Fxpls%2Fabs_all.jsp%3Farnumber%3D847511
dc.identifier.uri http://hdl.handle.net/123456789/1106
dc.description.abstract Significant differences have been found between measured and simulated data for collectors designed with codes which disregard the influence of secondary electrons. To solve this problem, various codes have been developed. These codes assume that secondary electrons are only emitted in a single direction and ignore their spatial distribution. We have developed a code in which secondary electron yield is calculated from an empirical formula and the emitted secondary electrons are assumed to have cosine spatial distribution. To represent this distribution, for each primary beam point of impact, the emitted secondary beam is split into 3 beams; one beam normal to the impact surface and the other two at an angle to the normal. The normal beam carries half of the current and the rest of the current is divided equally between the side beams. The code uses a two dimensional, axis symmetric Finite Element Method (FEM) for modeling. FEM has been chosen because of its ability to model accurately arbitrary shaped structures. We designed a ku-band (14.25 GHz), 2-stage TWT by using the developed code. en_US
dc.language.iso en en_US
dc.title Simulation of the influence of secondary electrons on the performance of potential depressed collectors for TWTs en_US
dc.type Article en_US


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