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Emittance measurement of high-brightness microbeams

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dc.contributor.author Musyoki, Stephen
dc.contributor.author Ishizuka, Hiroshi
dc.contributor.author Nakahara, Yuriko
dc.contributor.author Kawasaki, Sunao
dc.contributor.author Shimizu, Hiroshi
dc.contributor.author Watanabe, Akihiko
dc.contributor.author Shiho, Makoto
dc.date.accessioned 2015-05-20T04:27:48Z
dc.date.available 2015-05-20T04:27:48Z
dc.date.issued 1994
dc.identifier.citation Japanese Journal of Applied Physics Volume 33 Part 1, Number 9A en_US
dc.identifier.uri http://iopscience.iop.org/1347-4065/33/9R/5078
dc.identifier.uri http://hdl.handle.net/123456789/963
dc.description.abstract Arrays of microtriodes have recently become available due to the development of microfabricated field-emission electron sources. Computer simulation has shown that the brightness of beams emitted by them is significantly higher than that of the common microbeams, and possible application of the accelerated beam to free electron lasers has been discussed. Experimentation on beam generation has started, but methods for diagnosing the beam have not yet been established. Difficulty is predicted, because of the high brightness, in applying the conventional methods of emittance measurement. In this paper we propose a new method that determines the emittance without using apertures. The cross section of a converging beam is elongated by a quadrupole lens, and parameters of the emittance ellipse are obtained from the beam size on a screen when changing either the strength or the axial position of the quadrupole lens. en_US
dc.language.iso en en_US
dc.publisher Japanese Journal of Applied Physics en_US
dc.title Emittance measurement of high-brightness microbeams en_US
dc.type Article en_US

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