A new method of emittance measurement for electron beams from the Micro-emitter

dc.contributor.authorIshizuka, Hiroshi
dc.contributor.authorNakahara, Yuriko
dc.contributor.authorKawasaki, Sunao
dc.contributor.authorMusyoki, Stephen
dc.contributor.authorShimizu, Hiroshi
dc.contributor.authorWatanabe, Akihiko
dc.contributor.authorShiho, Makoto
dc.date.accessioned2015-05-26T15:47:15Z
dc.date.available2015-05-26T15:47:15Z
dc.date.issued1994
dc.description.abstractRecently a new type of cathode called Micor-emitter has been put in progress. This cathode is a microfabricated field emitter having the characteristics of very low emittance and high brightness. We cannot measure the emittance of the cathode with conventional methods like the pepper-pot method. The reasons are: (1) the angle between the electron orbit and the axis is very small and (2) we cannot focus the electron beam in the vacuum or on the surface of the material since the current density of the cathode is extremely high. For the emittance measurement for such low emittance and high brightness cathode, we need to expand the beam, and measure the beam's cross section without any slits or apertures. We studied and proposed a new emittance measurement method for the Micro-emitter.en_US
dc.identifier.urihttp://hdl.handle.net/123456789/1105
dc.language.isoenen_US
dc.subjectCathodesen_US
dc.subjectElectrical Measurementen_US
dc.subjectElectron Beamsen_US
dc.subjectElectron Gunsen_US
dc.subjectEmittanceen_US
dc.subjectEmittersen_US
dc.subjectField Emissionen_US
dc.subjectBrightnessen_US
dc.subjectCurrent Densityen_US
dc.subjectElectron Acceleratorsen_US
dc.subjectLensesen_US
dc.subjectQuadrupolesen_US
dc.titleA new method of emittance measurement for electron beams from the Micro-emitteren_US
dc.typeArticleen_US

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